Assume that we have a sequence of n independent and identically distributed random variables with a continuous distribution function F, which is specified up to a few unknown parameters. In this paper ...

Keithley Instruments has announced the publication of Parallel Test Technology: The New Paradigm for Parametric Testing, a handbook that covers semiconductor parametric testing. The free, 60-page book ...

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...

This is a preview. Log in through your library . Abstract Using a sample from an unknown bivariate distribution, we propose a test for the hypothesis that one marginal distribution is stochastically ...

January 23, 2014. Keithley Instruments Inc. has introduced the latest upgrades to its S530 Parametric Test Systems for high-speed production parametric test of semiconductors. These enhancements ...

October 22, 2012. Keithley Instruments Inc. has introduced seven instrumentation, software, and test-fixture configurations for parametric curve-tracing applications for characterizing high-power ...